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| THURSDAY, June 10, 2004, 2:00 PM - 4:00 PM | Room: 6B |
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TOPIC AREA: POWER
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SESSION 47
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| Leakage Power Optimization
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| Chair: Farid N. Najm - Univ. of Toronto, Toronto , Canada
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| Organizers: Enrico Macii, Naehyuck Chang
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| This session presents different approaches for reducing leakage power consumption in deep submicron CMOS circuits. The papers investigate different trade-offs between gate Tox, Vdd, Vth and sizing. Also, techniques for deriving input vector control and encoding schemes for simultanous crosstalk and leakage power reduction on buses are described.
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| 47.1 |
Tradeoffs between Gate Oxide Leakage and Delay for Dual Tox Circuits
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| Speaker(s): | Anup Kumar Sultania - Univ. of Minnesota, Minneapolis, MN
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| Author(s): | Anup Kumar Sultania - Univ. of Minnesota, Minneapolis, MN
Dennis Sylvester - Univ. of Michigan, Ann Arbor, MI
Sachin S. Sapatnekar - Univ. of Minnesota, Minneapolis, MN
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| 47.2 | Implicit Pseudo Boolean Enumeration Algorithms for Input Vector Control |
| Speaker(s): | Kaviraj S. Chopra - Univ. of Arizona, Tucson, AZ
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| Author(s): | Kaviraj S. Chopra - Univ. of Arizona, Tucson, AZ
Sarma Vrudhula - Univ. of Arizona, Tucson, AZ
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| 47.3 | Statistical Optimization of Leakage Power Considering Process Variations Using Dual-Vth and Sizing |
| Speaker(s): | Ashish Srivastava - Univ. of Michigan, Ann Arbor, MI
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| Author(s): | Ashish Srivastava - Univ. of Michigan, Ann Arbor, MI
Dennis Sylvester - Univ. of Michigan, Ann Arbor, MI
David Blaauw - Univ. of Michigan, Ann Arbor, MI
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| 47.4s | Leakage - and Crosstalk-Aware Bus Encoding for Total Power Reduction |
| Speaker(s): | Harmander S. Deogun - Univ. of Michigan, Ann Arbor, MI
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| Author(s): | Harmander S. Deogun - Univ. of Michigan, Ann Arbor, MI
Rajeev R. Rao - Univ. of Michigan, Ann Arbor, MI
Dennis Sylvester - Univ. of Michigan, Ann Arbor, MI
David Blaauw - Univ. of Michigan, Ann Arbor, MI
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| 47.5s | Power Minimization Using Simultaneous Gate Sizing, Dual-Vdd, and Dual-Vth Assignment |
| Speaker(s): | Ashish Srivastava - Univ. of Michigan, Ann Arbor, MI
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| Author(s): | Ashish Srivastava - Univ. of Michigan, Ann Arbor, MI
Dennis Sylvester - Univ. of Michigan, Ann Arbor, MI
David Blaauw - Univ. of Michigan, Ann Arbor, MI
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